Technical abstracts

Infrared ROIC for very low flux and very low noise applications

Proc. SPIE 8176, 81761I (2011); doi:10.1117/12.898987

Online Publication Date: Wednesday 02 November 2011

Conference Date: Monday 19 September 2011

Conference Location: Prague, Czech Republic

Conference Title: Sensors, Systems, and Next-Generation Satellites XV

Conference Chairs: Roland Meynart, Steven P. Neeck, Haruhisa Shimoda


Bruno Fièque, Lilian Martineau, Eric Sanson, and Philippe Chorier 
Olivier Boulade and Vincent Moreau 
CEA Saclay Service d'Astrophysique (France)
Hervé Geoffray 
Ctr. National d'Études Spatiales (France)


Sofradir is involved in the manufacturing of detectors which cover a large range of wavelengths in the infrared domain from SWIR up to VLWIR for different kind of applications. Thus, different types of ROIC architectures are needed to cover these various kind of applications and operating conditions. As a major player of the infrared market, Sofradir has developed numerous ROIC with architectures enabling to answer most of the infrared applications in tactical, commercial and space domains. Sofradir is now able to present a new detector (384x288 with a 15 ?m pitch) especially designed for very low flux applications in the SWIR domain (as astronomy for example). This new ROIC has been developed with CNES support and includes a SFD (Source Follower per Detectors) input stage enabling to achieve a high gain as well as a low readout noise and a vey low power consumption. In this paper, we will describe the architecture and functionalities of this new detector. Then, electro-optical characterizations and results will be described. Finally, main applications of this kind of detectors will be presented.

© 2011 COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

Bruno Fièque, Lilian Martineau, Eric Sanson, Philippe Chorier, Olivier Boulade, Vincent Moreau and Hervé Geoffray, "Infrared ROIC for very low flux and very low noise applications", Proc. SPIE 8176, 81761I (2011); doi:10.1117/12.898987


Technical abstracts