Latest developments in advanced MCT infrared cooled detectors

Proc. SPIE 8185, 818503 (2011); doi:10.1117/12.899998

Online Publication Date: Wednesday 02 November 2011

Conference Date: Friday 21 October 2011

Conference Location: Prague, Czech Republic

Conference Title: Electro-Optical and Infrared Systems: Technology and Applications VIII

Conference Chairs: David A. Huckridge, Reinhard R. Ebert

 

Yann Reibel, Rubaldo Laurent, Gwladys Bonnouvrier, Sebastien Verdet, David Billon-Lanfrey, Gerard Destéfanis, Laurent Mollard, Jacques Baylet, Johan Rothman, Guillaume Druart and Nicolas Guerineau, "Latest developments in advanced MCT infrared cooled detectors", Proc. SPIE 8185, 818503 (2011); doi:10.1117/12.899998

 

MCT technologies under development in France address strategic operational needs. This includes better identification range as well as lighter weight requirement, operation at higher detector temperature and cost reduction issues. This paper describes the status of MCT IR technology in France at Leti and Sofradir. A focus will be made on hot detector technology for SWAP applications. Solutions for high performance detectors such as dual bands or megapixels will be discussed. In the meantime, the development of avalanche photodiodes, integrated optics, or TV format with digital interface is key to bring customers cutting-edge functionalities.

© 2011 COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

http://dx.doi.org/10.1117/12.899998

Yann Reibel, Rubaldo Laurent, Gwladys Bonnouvrier, Sebastien Verdet, David Billon-Lanfrey, Gerard Destéfanis, Laurent Mollard, Jacques Baylet, Johan Rothman, Guillaume Druart and Nicolas Guerineau, "Latest developments in advanced MCT infrared cooled detectors", Proc. SPIE 8185, 818503 (2011); doi:10.1117/12.899998